Tektronix, a provider of test, measurement and monitoring instrumentation, has unveiled a fully integrated 40 Gb/s Programmable Pattern Generator (PPG). This 40 Gb/s PPG, along with the previously announced 40 Gb/s Programmable Error Detector now comprise a complete 40 Gb/s BERT solution. With 200 fs Random Jitter (RJ) and 8 ps risetime performance, the new Tektronix PPG4001 is able to support serial data testing at 40 Gb/s.
Design engineers developing high-speed data and long-haul communications technologies need t be able to test their SERDES, ICs, components, modules, and systems to ensure that they are working to specification. As data rates have continued to increase, engineers have struggled to find good test equipment options, particularly at 40 Gb/s. Extremely high-performance, easy to use integrated instruments such as the Tektronix PatternPro PPG and PED offerings change the game by enabling engineers to quickly and efficiently perform the needed tests.
“The demand for bandwidth is strongly driving new standards and applications such as 100G Ethernet, 400G Ethernet, OIF-CEI VSR, and coherent optical communications,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix. “The PPG4001 and PED4001 are the fastest fully integrated, benchtop instruments in the industry, giving engineers the instrument performance they need to test their ICs, optical transceivers, and systems.”
It’s critical that test equipment offer performance that exceeds what is being testing, otherwise the instrumentation becomes the limiting factor and reliable test results cannot be achieved. In addition, features such as programmable data rates, PRBS and programmable data, and jitter insertion are necessary to determine if a design will meet applications requirements. The PPG4001 has been designed to meet or exceed the requirements for performance and features for 40 Gb/s serial data applications.
In addition to high data rates and high-quality output signals, the PPG4001 increases engineer productivity with its built-in jitter stressing capabilities. The PPG4001 includes options for high-frequency jitter insertion (RJ, SJ, and BUJ) as well as low-frequency SJ. These built-in options are front panel push button or remotely programmable and allow for comprehensive stress testing of optical modules and electrical SERDES devices.
Ease of use features include a front panel touchscreen with a simple GUI and no instrument “reconfiguration” or characterization in order to move from one test standard to the next. It also offers a wide range of programmable data rates and patterns, covering all of the operating conditions needed to comprehensively verify product performance and functionality.