New parameter analyser reduces characterisation complexity, speeds time to insight

Tektronix, a leading worldwide provider of measurement solutions, has introduced the customisable and fully integrated Keithley 4200A-SCS parameter analyser that accelerates semiconductor device, materials and process insights by reducing characterisation complexity for new or sporadic users, simplifying test setup, and delivering clear, precise results.

 

Building on the success of the Keithley 4200-SCS parameter analyser, the new 4200A-SCS instrument features a modern industrial design, a new graphical user interface and a range of helpful self-learning tools such as expert instructional videos embedded into the instrument. The result is up to 50 per cent reduction in test setup times and significantly easier and more intuitive operation. Usability is particularly important for applications such as semiconductor device research, device failure analysis or reliability testing where instruments are a shared resource among multiple users.

 

“Parameter analysis is critical to characterising new semiconductor devices, materials or testing the reliability of devices before commercial use. However, researchers may only need to perform these tests sporadically, making it hard for them to become experts at using parametric testing instrumentation,” said Mike Flaherty, general manager, Keithley product line at Tektronix. “That’s why we went to great lengths to make the 4200A-SCS exceptionally easy to set up and easy to learn how to operate even for users with no prior experience with a parameter analyser.”

 

New switch module

Knowing that various measurements adds additional complexity to semiconductor research, Tektronix is also introducing the Keithley 4200A-CVIV four channel IV/CV switch module. This module for use with the 4200A-SCS mainframe provides on-the-fly switching between SMU (I-V) and capacitance-voltage (C-V) measurements, allowing users to move C-V measurements to any device terminal without lifting prober needles or moving cables.

 

With a new widescreen high-definition display, the 4200A-SCS offers more screen real-estate for interactive testing and experimentation. This display is coupled with a completely new graphical user interface that delivers the intuitive operation sporadic users need while still offering the advanced features required by expert users. The new user interface includes expert videos that capture the knowledge and wisdom of Keithley application engineers from around the world. These videos reduce the user’s learning curve and help them troubleshoot when unexpected results occur while building confidence in the results they are seeing.

 

Like the instrument it replaces, the 4200A-SCS is a modular, fully integrated parameter analyser that performs electrical characterisation of materials, semiconductor devices and processes. Consisting of Source Measure Units for I-V characterisation, Capacitance-Voltage module for AC impedance measurements, and Ultra-fast Pulse Measure Unit that performs pulsed I-V, waveform capture, and transient I-V measurements, the 4200A-SCS provides the researcher or engineer with critical parameters needed for materials research, semiconductor device design, development or production.

 

www.tektronix.com

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