Agilent Technologies has unveiled the E6640A EXM wireless test set. Designed to offer manufacturing-test scalability in technology coverage, performance and capacity in can test up to 32 cellular and wireless-connectivity devices in parallel.
The EXM is intended to offer manufacturers greater speed, accuracy and multi-port density in order to ramp up production rapidly and to optimise full-volume manufacturing. To accelerate test development, the EXM is synchronised with the latest cellular and WLAN chipsets.
“To solve today’s manufacturing problems, our customers want the fastest, most accurate parallel device test to maximise throughput and yield,” explained Guy Séné, Agilent senior vice president and Electronic Measurement Group president. “The EXM looks to address these needs, and as test requirements change, it offers modular scalability so manufacturers can evolve their test stations faster and keep pace with next-generation devices and standards at the lowest cost of test.”
The EXM can be configured with up to four independent transmit/receive (TRX) channels, each of which is a complete vector signal generator and vector signal analyzer. Each TRX includes four RF ports, two full-duplex and two half-duplex, to provide industry-leading port density. To further extend scalability and port density, the EXM can be customized to connect up to 32 devices-under-test through multi-port adapter (MPA) technology.
For use with highly integrated devices, the EXM offers 160-MHz bandwidth, up to 6-GHz frequency range, and the broadest choice of multi-format coverage, from LTE-Advanced in cellular to 802.11ac with multiple-input/multiple-output (MIMO) in wireless connectivity. The industry-proven Agilent X-Series measurement applications provide a wide range of standard-specific calibration and verification test capabilities.
To maximize production throughput, the EXM is equipped with a quad-core processor, high-bandwidth PXIe backplane and advanced sequence analyzer capabilities. To further reduce test time, the EXM includes the ability to make multiple measurements on a single set of acquired data.