CIE Components in Electronics
Infrared measurement adds important and often revealing data to certain types of R&D analysis, but it hasn’t always been easy to incorporate these measurements into experiments and reports. To close that gap, Fluke has introduced a new software feature that integrates high-resolution thermal data from the company’s TiX580 and TiX560 infrared cameras with National Instruments’ LabVIEW and MathWorks’ MATLAB software, leveraging the strength of those powerful platforms and making it easy to add high-resolution infrared data, video and images to R&D analysis and reporting. More information can be found at www.fluke.com/infrared-r-and-d which also provides links to the two cameras.
Once installed, the software allows continuous download of pixel-by-pixel, high-resolution radiometric data. R&D professionals can now use any of these two highest-resolution Fluke infrared cameras to thermally capture video and port the video data frame-by-frame into their MATLAB or LabVIEW software, and monitor it over time, identifying very small temperature changes that could indicate problems.
The TiX580 Infrared Camera, the newest addition to the Fluke high-resolution line of cameras, features 640 x 480 resolution for high measurement accuracy and an intuitive interface, making it easy to use for electronic design and validation, material science evaluations, and thermal modeling. Designed for exacting R&D engineers, scientists, and researchers, the TiX580 features a 240-degree rotating screen that allows R&D professionals to easily perform non-destructive testing over, under, and around objects to preview and capture images with ease.
