CIE Components in Electronics
Cyntech Components has introduced new high-temperature 250°C QFP/QFN Test Sockets from US Manufacturer, Aries Electronics. The 24001HT series contact strip sockets are suitable for testing devices in need of high temperature testing as well as “down-hole” devices.
Where normal test socket performance, using industry standard beryllium-copper (BeCu) contacts, rolls off sharply above 150°C, these new sockets perform up to 250°C.
The sockets are fully (X, Y & Z) customisable, with machined bodies available in virtually any size, on lead pitches of 0.4mm and higher. The contact material is stainless steel offering a very low inductance (0.01nH) signal path in addition to its high-temperature performance. It is rated to at least 19Ghz (-1dB) and has an estimated life of about 500k cycles.
The insulator material is machined PEEK which incorporates a proprietary high-temperature material that bonds the contact strips onto the socket frame. The contact strips are readily available and user replaceable for easy field maintenance. Any peripherally leaded devices (such as QFN/QFP/MLF/SSOP) can be accommodated within this socket. Ground leads and centre pads are available upon request.
“Using stainless steel as the contact material in its patented Microstrip contact design has allowed Aries to create a test socket that combines excellent RF performance with high temperature operation”, explained Dave Mellor, Cyntech Components’ managing director, adding, “These benefits are what distinguish Aries as a leading manufacturer of IC test sockets.”
