“Until now, testing and simulating LTE fading profiles meant buying and cabling together two separate test instruments. By integrating the LTE fading simulator into the 7100 Series, Aeroflex will save customers tens of thousands of euros in purchasing additional test equipment and circumvent potential calibration errors that cause faulty test results. In addition, confidence is boosted by the repeatability of the fading profiles,” said Phil Medd, product manager, Aeroflex Test Solutions.

Fading simulators, combined with noise generators, modify RF signals transmitted by the LTE system simulator (in this case the 7100 Series) and emulate degradations introduced into the radio channel by real-life obstacles such as buildings and foliage. For LTE developers who must profile signal fading on mobile handsets to meet 3GPP requirements before a network is available, the 7100 Series fading simulator allows engineers to perform realistic signal fading simulations in a reliable and repeatable lab environment.

The Aeroflex 7100 Series test platform provides fading simulation that meets or exceeds all 3GPP requirements, as well as an unprecedented degree of flexibility in allocating cells and fading taps for LTE user equipment (UE) without the need for manual reconfiguration. The fully repeatable test scenarios presented by the 7100 Series with the fading simulator include the emulation of dynamic environments and realistic and accurate testing of MIMO (multiple-input/multiple output) scenarios.

The 7100 Series fading simulator supports all LTE bandwidths to 20 MHz with a frequency range up to 6 GHz and the Aeroflex fading simulator supports all 3GPP fading profiles, allowing users to determine if their device conforms to 3GPP test specifications.

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