- 23 May, 2012
ElectroTestExpo - 27 June, 2012
Embedded Masterclass 2012
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JTAG Technologies has released its latest development and hardware debug tool, JTAG ProVision V1.8, that combines advanced automation with control and precision for engineers creating test programmes and in-system programming (ISP) routines for PLDs, FPGAs, flash memories, serial PROMs and other devices.
Enhancements to the ProVision version (V1.8) include:-
- New pin-level ActiveTest - an interactive cluster test generator;
- Enhanced NAND flash ISP program generator;
- ‘Buzz’ – the quick and easy continuity test module for checking hidden open circuits;
- Built-in test debug capabilities for Symphony supported In-Circuit Testers and Flying-Probe Testers;
- Support for ‘private’ and seldom-used JTAG instructions with the JFT (Python) script routines;
- Multi-board, and scan bridge support for JFT(Python) script routines; and
- Expanded ProVision model library, now containing models for more than 7,500 non-boundary-scan device families, covering more than 78,000 different devices.
James Stanbridge, JTAG Technologies’ Sales Manager UK, commenting said: “The enhancements to ProVision represent considerable value-added to the user and once again endorse our commitment to providing the best quality software tools at the most competitive prices. As usual, many of the new features are at the direct request of our customers and have been incorporated promptly and diligently.”
As with previous releases, JTAG ProVision remains fully compatible with the prior “Classic” development tools as well as with all of JTAG Technologies’ production systems. In addition, the latest version of JTAG ProVision is available free of charge to customers with valid maintenance contracts.
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